CVE-2024-53017
Memory corruption while handling test pattern generator IOCTL command.
Scoring
- Severity
- MEDIUM
- CVSS base score
- 6.6
- CVSS vector
- CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
- EPSS probability
- 0.09%
- CWE
- CWE-823
- Published
- 2025-06-03
- Last modified
- 2026-03-13
Affected products
- Qualcomm, Inc. Snapdragon
- Qualcomm, Inc. Snapdragon
- Qualcomm, Inc. Snapdragon
- Qualcomm, Inc. Snapdragon
Weakness type
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