# CVE-2024-53017

## Summary

- **CVE ID:** CVE-2024-53017
- **Severity:** MEDIUM
- **CVSS Score:** 6.6 (CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L)
- **CWE:** CWE-823
- **Published:** Jun 3, 2025
- **Last Modified:** Mar 13, 2026

## Description

Memory corruption while handling test pattern generator IOCTL command.

## Affected Products

- Qualcomm, Inc. — Snapdragon (SDM429W)
- Qualcomm, Inc. — Snapdragon (Snapdragon 429 Mobile Platform)
- Qualcomm, Inc. — Snapdragon (WCN3620)
- Qualcomm, Inc. — Snapdragon (WCN3660B)

## References

- [CNA](https://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.html)

## Exploitation Prediction (EPSS)

- **EPSS Score:** 0.09%
- **EPSS Percentile:** 0.5

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_Exported from OnDuty AI Vulnerability Intelligence on 2026-09-10._